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This work is licensed under a Creative Commons Attribution 4.0 International License.
Microstructure and Optical Properties of BaMO4 (M = Mo, W) Particles Synthesized by Microwave-Assisted Metathetic Method
Corresponding Author(s) : Chang Sung Lim
Asian Journal of Chemistry,
Vol. 26 No. 5 (2014): Vol 26 Issue 5
Abstract
The BaMO4 (M = Mo, W) particles have been synthesized successfully by a cyclic microwave-assisted metathetic method followed by heat-treatment. Well-crystallized BaMO4 (M = Mo, W) particles with a fine and octahedron-like morphology and the particle size of 1-2 μm have been formed after annealing at 600 ºC for 3 h. The synthesized BaMO4 (M = Mo, W) particles have been characterized by X-ray diffraction and scanning electron microscopy. The optical properties have been investigated by photoluminescence emission and Raman spectroscopy.
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- Z. Shan, Y. Wang, H. Ding and F. Huang, J. Mol. Catal. A, 302, 54 (2009); doi:10.1016/j.molcata.2008.11.030.
- S. Rajagopal, V.L. Bekenev, D. Nataraj, D. Mangalaraj and O.Y. Khyzhun, J. Alloys Comp., 496, 61 (2010); doi:10.1016/j.jallcom.2010.02.107.
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- S. Thongtem, S. Wannapop and T. Thongtem, Nonferr. China, 19, s100 (2009); doi:10.1016/S1003-6326(10)60254-3.
- G. Zhang, R. Jia and Q. Wu, Mater. Sci. Eng. B, 128, 254 (2006); doi:10.1016/j.mseb.2005.11.040.
- D. Rangappa, T. Fujiwara, T. Watanabe and M. Yoshimura, J. Electroceram., 17, 853 (2006); doi: 10.1007/s10832-006-0459-z.
- Y. Wang, J. Ma, J. Tao, X. Zhu, J. Zhou, Z. Zhao, L. Xie and H. Tian, Mater. Sci. Eng. B, 130, 277 (2006); doi:10.1016/j.mseb.2006.02.012.
- K. Eda, Y. Kato, Y. Ohshiro, T. Sugitani and M.S. Whittingham, J. Solid State Chem., 183, 1334 (2010); doi:10.1016/j.jssc.2010.04.009.
- J.T. Kloprogge, M.L. Weier, L.V. Duong and R.L. Frost, Mater. Chem. Phys., 88, 438 (2004); doi:10.1016/j.matchemphys.2004.08.013.
- P. Parhi, T.N. Karthik and V. Manivannan, J. Alloys Comp., 465, 380 (2008); doi:10.1016/j.jallcom.2007.10.089.
- S. Das, A.K. Mukhopadhyay, S. Datta and D. Basu, Bull. Mater. Sci., 32, 1 (2009); doi:10.1007/s12034-009-0001-4.
- C.S. Lim, J. Lumin., 132, 1774 (2012); doi:10.1016/j.jlumin.2012.02.024.
- C.S. Lim, Mater. Res. Bull., 47, 4220 (2012); doi:10.1016/j.materresbull.2012.09.029.
- C.S. Lim, Mater. Chem. Phys., 131, 714 (2012); doi:10.1016/j.matchemphys.2011.10.039.
- D.A. Spassky, S.N. Ivanov, V.N. Kolobanov, V.V. Mikhailin, V.N. Zemskov, B.I. Zadneprovski and L.I. Potkin, Radiat. Measur., 38, 607 (2004); doi:10.1016/j.radmeas.2004.03.019.
- G.Y. Hong, B.S. Jeon, Y.K. Yoo and J.S. Yoo, J. Electrochem. Soc., 148, H161 (2001); doi:10.1149/1.1406496.
- K. Polak, M. Nikl, K. Nitsch, M. Kobayashi, M. Ishii, Y. Usuki and O. Jarolimek, J. Lumin., 72-74, 781 (1997); doi:10.1016/S0022-2313(97)00079-3.
- Y. Toyozawa and M. Inoue, J. Phys. Soc. Jpn., 21, 1663 (1966); doi:10.1143/JPSJ.21.1663.
- E.G. Reut, Izv. Akad. Nauk SSSR, Ser. Fiz., 43, 1186 (1979).
- Y. Zhang, N.A.W. Holzwarth and R.T. Williams, Phys. Rev. B, 57, 12738 (1998); doi:10.1103/PhysRevB.57.12738.
- J. Van Tol, Mol. Phys., 88, 803 (1996); doi:10.1080/00268979650026316.
- V.B. Mikhailik, H. Kraus, D. Wahl and M.S. Mykhaylyk, Phys. Status Solid B, 242, R17 (2005); doi:10.1002/pssb.200409087.
- T.T. Basiev, A.A. Sobol, P.G. Zverev, L.I. Ivleva, V.V. Osiko and R.C. Powell, Opt. Mater., 11, 307 (1999); doi:10.1016/S0925-3467(98)00030-5.
References
Z. Shan, Y. Wang, H. Ding and F. Huang, J. Mol. Catal. A, 302, 54 (2009); doi:10.1016/j.molcata.2008.11.030.
S. Rajagopal, V.L. Bekenev, D. Nataraj, D. Mangalaraj and O.Y. Khyzhun, J. Alloys Comp., 496, 61 (2010); doi:10.1016/j.jallcom.2010.02.107.
T. Thongtem, S. Kungwankunakorn, B. Kuntalue, A. Phuruangrat and S. Thongtem, J. Alloys Comp., 506, 475 (2010); doi:10.1016/j.jallcom.2010.07.033.
A.J. Rondinone, M. Pawel, D. Travaglini, S. Mahurin and S. Dai, J. Colloid Interf. Sci., 306, 281 (2007); doi:10.1016/j.jcis.2006.10.064.
S. Thongtem, S. Wannapop and T. Thongtem, Nonferr. China, 19, s100 (2009); doi:10.1016/S1003-6326(10)60254-3.
G. Zhang, R. Jia and Q. Wu, Mater. Sci. Eng. B, 128, 254 (2006); doi:10.1016/j.mseb.2005.11.040.
D. Rangappa, T. Fujiwara, T. Watanabe and M. Yoshimura, J. Electroceram., 17, 853 (2006); doi: 10.1007/s10832-006-0459-z.
Y. Wang, J. Ma, J. Tao, X. Zhu, J. Zhou, Z. Zhao, L. Xie and H. Tian, Mater. Sci. Eng. B, 130, 277 (2006); doi:10.1016/j.mseb.2006.02.012.
K. Eda, Y. Kato, Y. Ohshiro, T. Sugitani and M.S. Whittingham, J. Solid State Chem., 183, 1334 (2010); doi:10.1016/j.jssc.2010.04.009.
J.T. Kloprogge, M.L. Weier, L.V. Duong and R.L. Frost, Mater. Chem. Phys., 88, 438 (2004); doi:10.1016/j.matchemphys.2004.08.013.
P. Parhi, T.N. Karthik and V. Manivannan, J. Alloys Comp., 465, 380 (2008); doi:10.1016/j.jallcom.2007.10.089.
S. Das, A.K. Mukhopadhyay, S. Datta and D. Basu, Bull. Mater. Sci., 32, 1 (2009); doi:10.1007/s12034-009-0001-4.
C.S. Lim, J. Lumin., 132, 1774 (2012); doi:10.1016/j.jlumin.2012.02.024.
C.S. Lim, Mater. Res. Bull., 47, 4220 (2012); doi:10.1016/j.materresbull.2012.09.029.
C.S. Lim, Mater. Chem. Phys., 131, 714 (2012); doi:10.1016/j.matchemphys.2011.10.039.
D.A. Spassky, S.N. Ivanov, V.N. Kolobanov, V.V. Mikhailin, V.N. Zemskov, B.I. Zadneprovski and L.I. Potkin, Radiat. Measur., 38, 607 (2004); doi:10.1016/j.radmeas.2004.03.019.
G.Y. Hong, B.S. Jeon, Y.K. Yoo and J.S. Yoo, J. Electrochem. Soc., 148, H161 (2001); doi:10.1149/1.1406496.
K. Polak, M. Nikl, K. Nitsch, M. Kobayashi, M. Ishii, Y. Usuki and O. Jarolimek, J. Lumin., 72-74, 781 (1997); doi:10.1016/S0022-2313(97)00079-3.
Y. Toyozawa and M. Inoue, J. Phys. Soc. Jpn., 21, 1663 (1966); doi:10.1143/JPSJ.21.1663.
E.G. Reut, Izv. Akad. Nauk SSSR, Ser. Fiz., 43, 1186 (1979).
Y. Zhang, N.A.W. Holzwarth and R.T. Williams, Phys. Rev. B, 57, 12738 (1998); doi:10.1103/PhysRevB.57.12738.
J. Van Tol, Mol. Phys., 88, 803 (1996); doi:10.1080/00268979650026316.
V.B. Mikhailik, H. Kraus, D. Wahl and M.S. Mykhaylyk, Phys. Status Solid B, 242, R17 (2005); doi:10.1002/pssb.200409087.
T.T. Basiev, A.A. Sobol, P.G. Zverev, L.I. Ivleva, V.V. Osiko and R.C. Powell, Opt. Mater., 11, 307 (1999); doi:10.1016/S0925-3467(98)00030-5.