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Optical, Structural and Gas Sensing Studies on Tin Oxide Thin Films
Corresponding Author(s) : Rajesh Kumar
Asian Journal of Chemistry,
Vol. 31 No. 8 (2019): Vol 31 Issue 8
Abstract
In this paper, pure and copper doped tin oxide thin films were grown on glass substrates by thermal evaporation technique for gas sensing applications. Optical, structural and gas sensing properties were investigated for their application for gas sensing applications. The thickness of the samples was kept about 300 nm. The films were annealed at 400 ºC for 4 h in the presence of air. The gas sensing studies were carried out for hydrogen sulphide and ethanol gas. The sensitivity was quite high for hydrogen sulphide gas but little sensitivity towards hydrocarbon gases.
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- B. Elvers, S. Hawkins and G. Schulz, Ullmann Encyclopedia of Industrial Chemistry, VCH: Weinheim, vol. A13, p. 467 (1989).
- L.D. Loch, J. Electrochem. Soc., 110, 1081 (1963); https://doi.org/10.1149/1.2425588.
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- O.K. Varghese and L.K. Malhotra, Sens. Actuators B Chem., 53, 19 (1998); https://doi.org/10.1016/S0925-4005(98)00288-3.
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- S.K. Tripathy, B.P. Hota and P.V. Rajeswari, Bull. Mater. Sci., 36, 1231 (2013); https://doi.org/10.1007/s12034-013-0582-9.
- J.O. Ajayi and D.B. Agunbiade, Int. J. Res. Appl. Sci. Eng. Technol., 3, 821 (2015).
- P.G.L. Baker, R.D. Sanderson and A.M. Crouch, Thin Solid Films, 515, 6691 (2007); https://doi.org/10.1016/j.tsf.2007.01.042.
- T. Pradeep, A Textbook of Nanoscience and Nanotechnology, McGraw Hill Education, 4th Reprint (2012).
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References
B. Elvers, S. Hawkins and G. Schulz, Ullmann Encyclopedia of Industrial Chemistry, VCH: Weinheim, vol. A13, p. 467 (1989).
L.D. Loch, J. Electrochem. Soc., 110, 1081 (1963); https://doi.org/10.1149/1.2425588.
C. Kilic and A. Zunger, Phys. Rev. Lett., 88, 095501 (2002); https://doi.org/10.1103/PhysRevLett.88.095501.
M.S. Arnold, P. Avouris, Z.W. Pan and Z.L. Wang, J. Phys. Chem. B, 107, 659 (2003); https://doi.org/10.1021/jp0271054.
A.M. Gheidari, E.A. Soleimani, M. Mansorhoseini, S. Mohajerzadeh, N. Madani and W. Shams-Kolahi, Mater. Res. Bull., 40, 1303 (2005); https://doi.org/10.1016/j.materresbull.2005.04.007.
M. Nakagawa, T. Amano and S. Yokokura, J. Non-Cryst. Solids, 218, 100 (1997); https://doi.org/10.1016/S0022-3093(97)00238-X.
U. Betz, M. Kharrazi Olsson, J. Marthy, M.F. Escolá and F. Atamny, Surf. Coat. Technol., 200, 5751 (2006); https://doi.org/10.1016/j.surfcoat.2005.08.144.
N. Butta, L. Cinquegrani, E. Mugno, A. Tagliente and S. Pizzini, Sens. Actuators B Chem., 6, 253 (1992); https://doi.org/10.1016/0925-4005(92)80064-5.
A. Keshavaraja, B.S. Jayashri, A.V. Ramaswamy and K. Vijayamohanan, Sens. Actuators B Chem., 23, 75 (1995); https://doi.org/10.1016/0925-4005(94)01528-P.
G.H. Lindner, Non-iridescent, Haze-free Infrared Reflecting Coated Glass Structures, U.S. Patent 4737388 (1988).
O.K. Varghese and L.K. Malhotra, Sens. Actuators B Chem., 53, 19 (1998); https://doi.org/10.1016/S0925-4005(98)00288-3.
N.S. Baik, G. Sakai, N. Miura and N. Yamazoe, Sens. Actuators B Chem., 63, 74 (2000); https://doi.org/10.1016/S0925-4005(99)00513-4.
R.S. Niranjan and I.S. Mulla, Mater. Sci. Eng. B, 103, 103 (2003); https://doi.org/10.1016/S0921-5107(03)00154-5.
E. Comini, G. Faglia, G. Sberveglieri, Z. Pan and Z.L. Wang, Appl. Phys. Lett., 81, 1869 (2002); https://doi.org/10.1063/1.1504867.
V.S. Vaishnav, P.D. Patel and N.G. Patel, Thin Solid Films, 490, 94 (2005); https://doi.org/10.1016/j.tsf.2005.04.006.
P.M. Gorley, V.V. Khomyak, S.V. Bilichuk, I.G. Orletsky, P.P. Horley and V.O. Grechko, Mater. Sci. Eng., 118, 160 (2005); https://doi.org/10.1016/j.mseb.2004.12.026.
J. Jeorg, S.P. Choi, K.J. Hong, H.J. Song and J.S. Park, J. Korean Phys. Soc., 48, 960 (2006).
C.K. Kim, S.M. Choi, H. Noh, J.H. Lee, C. Hong, H.B. Chae, G.E. Jang and H.D. Park, Sens. Actuators B Chem., 77, 463 (2001); https://doi.org/10.1016/S0925-4005(01)00726-2.
H. Pirmoradi, J. Malakootikhah, M. Karimipour, A. Ahmadpour, N. Shahtahmasebi and F.E. Koshky, Middle East J. Sci. Res., 8, 253 (2011).
O. Culha, M.F. Ebeoglugil, I. Birlik, E. Celik and M. Toparli, J. SolGel Sci. Technol., 51, 32 (2009); https://doi.org/10.1007/s10971-009-1956-8.
V. Guidi, M.A. Butturi, M.C. Carotta, B. Cavicchi, M. Ferroni, C. Malagu, G. Martinelli, D. Vincenzi, M. Sacerdoti and M. Zen, Sens. Actuators B Chem., 84, 72 (2002); https://doi.org/10.1016/S0925-4005(01)01077-2.
D.S. Vlachos, C.A. Papadopoulos and J.N. Avaritsiotis, J. Appl. Phys., 80, 6050 (1996); https://doi.org/10.1063/1.363562.
C. Xu, J. Tamaki, N. Miura and N. Yamazoe, Sens. Actuators B Chem., 3, 147 (1991); https://doi.org/10.1016/0925-4005(91)80207-Z.
T. Becker, S. Ahlers, C. Bosch-v.Braunmühl, G. Müller and O. Kiesewetter, Sens. Actuators B Chem., 77, 55 (2001); https://doi.org/10.1016/S0925-4005(01)00672-4.
F. Hossein-Babaei and M. Orvatinia, Sens. Actuators B Chem., 89, 256 (2003); https://doi.org/10.1016/S0925-4005(02)00472-0.
J. Tamaki, T. Maekawa, N. Miura and N. Yamazoe, Sens. Actuators B Chem., 9, 197 (1992); https://doi.org/10.1016/0925-4005(92)80216-K.
D.J. Yoo, J. Tamaki, S.J. Park, NorioMiura and N. Yamazoe, Jpn. J. Appl. Phys., 34(Part 2, No. 4A), L455 (1995); https://doi.org/10.1143/JJAP.34.L455.
S.-C. Lee, J.-H. Lee, T.-S. Oh and Y.-H. Kim, Sol. Energy Mater. Sol. Cells, 75, 481 (2003); https://doi.org/10.1016/S0927-0248(02)00201-5.
S.K. Tripathy, B.P. Hota and P.V. Rajeswari, Bull. Mater. Sci., 36, 1231 (2013); https://doi.org/10.1007/s12034-013-0582-9.
J.O. Ajayi and D.B. Agunbiade, Int. J. Res. Appl. Sci. Eng. Technol., 3, 821 (2015).
P.G.L. Baker, R.D. Sanderson and A.M. Crouch, Thin Solid Films, 515, 6691 (2007); https://doi.org/10.1016/j.tsf.2007.01.042.
T. Pradeep, A Textbook of Nanoscience and Nanotechnology, McGraw Hill Education, 4th Reprint (2012).
T. Maekawa, J. Tamaki, N. Miura and N. Yamazoe, J. Mater. Chem., 4, 1259 (1994); https://doi.org/10.1039/JM9940401259.
T.W. Capehart and S.C. Chang, J. Vac. Sci. Technol., 18, 393 (1981); https://doi.org/10.1116/1.570794.