Copyright (c) 2024 A Saritha Chandran
This work is licensed under a Creative Commons Attribution 4.0 International License.
Dielectric and Conductive Characteristics of Polyaniline Coated Short Nylon Fiber Chloroprene Rubber Composites: A Comprehensive Study on Frequency, Temperature and Loading Dependencies
Corresponding Author(s) : A Saritha Chandran
Asian Journal of Chemistry,
Vol. 36 No. 2 (2024): Vol 36 Issue 2, 2024
Abstract
In delving into the realm of conducting polymer composites (CPCs), specifically focusing on polyaniline (PANI), polyaniline coated
short fibers of nylon (PANI-N) and chloroprene rubber (CR), this study takes an exploratory journey. Blending PANI/PANI-N/CR and
PANI/CR CPCs mechanically, while adding short nylon fibers significantly improves their mechanical strength. These strong and durable CPCs possess significant promise for a wide range of applications in various devices. Present research methodically probes the dielectric features of CR, PANI/CR and PANI/PANI-N/CR composites across a frequency range of 0.1 to 8 MHz and a temperature span of 303 to 393 K. The results highlight potential correlations between mechanical properties and dielectric behaviour, paving the way for tailored approaches in developing high-performance conducting polymer composites for advanced applications. The study also utilizes theoretical equations and mixing models, which ensures a rigorous validation process that enhances accuracy.
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- A. Bhattacharya and A. De, Prog. Solid State Chem., 24, 141 (1996); https://doi.org/10.1016/0079-6786(96)00002-7
- Y. Wang, Int. J. Mater. Res., 105, 1 (2014); https://doi.org/10.3139/146.014012
- M. Wen, Y. Zhao, Z. Li, S. Lai, Q. Zeng, C. Liu and Y. Liu, Diamond Related Materials, 111, 108219 (2021); https://doi.org/10.1016/j.diamond.2020.108219
- C.H. Chang, M.H. Yun and W.J. Choi, Synth. Met., 145, 1 (2004); https://doi.org/10.1016/j.synthmet.2004.01.012
- M. Tabellout, K. Fatyeyeva, P.Y. Baillif, J.F. Bardeau and A.A. Pud, J. Non-Cryst. Solids, 351, 2835 (2005); https://doi.org/10.1016/j.jnoncrysol.2005.04.085
- H.C. Pant, M.K. Patra, S.C. Negi, A. Bhatia, S.R. Vadera and N. Kumar, Bull. Mater. Sci., 29, 379 (2006); https://doi.org/10.1007/BF02704139
- A. Dey, S. De, A. De and S.K. De, Nanotechnology, 15, 9 (2004); https://doi.org/10.1088/0957-4484/15/9/028
- B.K. Sharma, N. Khare, S.K. Dhawan and H.C. Gupta, J. Alloys Compd., 477, 370 (2009); https://doi.org/10.1016/j.jallcom.2008.10.004
- J. Joo, S.M. Long, J.P. Pouget, E.J. Oh, A.G. MacDiarmid and A.J. Epstein, Phys. Rev. B Condens. Matter, 57, 9567 (1998); https://doi.org/10.1103/PhysRevB.57.9567
- B.K. Sharma, N. Khare, R. Sharma, S.K. Dhawan, V.D. Vankar and H.C. Gupta, Compos. Sci. Technol., 69, 1932 (2009); https://doi.org/10.1016/j.compscitech.2009.04.012
- M.G.I. Han and S.S. Im, J. Appl. Polym. Sci., 71, 2169 (1999); https://doi.org/10.1002/(SICI)1097-4628(19990328)71:13<2169:: AID-APP7>3.0.CO;2-P
- P. Lv, Y. Zhao, F. Liu, G. Li, X. Dai, X. Ji, Z. Dong and X. Qiu, Appl. Surf. Sci., 367, 335 (2016); https://doi.org/10.1016/j.apsusc.2016.01.181
- R. Kannusamy, K. Prem Nazeer, A. Abiram, P. Kolandaivel and A. Ayesha Begam, Int. J. Sci. Humanit., 1, 107 (2015).
- M.S. Pinho, M. Dezotti, M.M. Gorelova and B.G. Soares, J. Appl. Polym. Sci., 71, 2329 (1999); https://doi.org/10.1002/(SICI)1097-4628(19990404)71:143.0.CO;2-Y
- K. Pielichowski, J. Therm. Anal. Calorim., 54, 171 (1998); https://doi.org/10.1023/A:1010129205138
- S. Ameen, V. Ali, M. Zulfequar, M. Mazharul Haq and M. Husain, Physica B, 403, 2861 (2008); https://doi.org/10.1016/j.physb.2008.02.025
- J. Bhadra, N.J. Al-Thani, N.K. Madi and M.A. Al-Maadeed, Arab. J. Chem., 10, 664 (2017); https://doi.org/10.1016/j.arabjc.2015.04.017
- J. Bhadra, N.K. Madi, N.J. Al-Thani and M.A. Al-Maadeed, Synth. Met., 191, 126 (2014); https://doi.org/10.1016/j.synthmet.2014.03.003
- G.P. Joshi and S.M. Pawde, J. Appl. Polym. Sci., 102, 1014 (2006); https://doi.org/10.1002/app.24062
- C. Min, X. Shen, Z. Shi, L. Chen and Z. Xu, Polym. Plast. Technol. Eng., 49, 1172 (2010); https://doi.org/10.1080/03602559.2010.496405
- V. Siva, D. Vanitha, A. Murugan, A. Shameem and S.A. Bahadur, Compos. Commun., 23, 100597 (2021); https://doi.org/10.1016/j.coco.2020.100597
- S. Parida, R.K. Parida, R. Padhee, N.C. Nayak and B.N. Parida, Mater. Sci. Eng. B, 275, 115497 (2022); https://doi.org/10.1016/j.mseb.2021.115497
- S. Bhadra, N.K. Singha and D. Khastgir, Curr. Appl. Phys., 9, 396 (2009); https://doi.org/10.1016/j.cap.2008.03.009
- E.S. Matveeva, Synth. Met., 79, 127 (1996); https://doi.org/10.1016/0379-6779(96)80180-9
- M. Trihotri, U.K. Dwivedi, F.H. Khan, M.M. Malik and M.S. Qureshi, J. Non-Cryst. Solids, 421, 1 (2015); https://doi.org/10.1016/j.jnoncrysol.2015.04.020
- S. More, R. Dhokne and S. Moharil, Polym. Bull., 75, 909 (2018); https://doi.org/10.1007/s00289-017-2069-0
- A. Dixit and H.S. Mali, J. Compos. Mater., 49, 1 (2013); https://doi.org/10.1007/s11029-013-9316-8
- K.P. Ahmad, W. Pan and S.-L. Shi, Appl. Phys. Lett., 89, 133122 (2006); https://doi.org/10.1063/1.2357920
- W. Zheng and S.-C. Wong, Compos. Sci. Technol., 63, 225 (2003);
- https://doi.org/10.1016/S0266-3538(02)00201-4
- A.S. Chandran and S.K. Narayanankutty, Eur. Polym. J., 44, 2418 (2008); https://doi.org/10.1016/j.eurpolymj.2008.05.012
- A.S. Chandran and S.K. Narayanankutty, J. Mater. Sci., 24, 8 (2009); https://doi.org/10.1557/jmr.2009.0329
- A. Goswami, Thin Film Fundamentals, New Age International (P) Limited Publishers: New Delhi, India (1996).
- C. Ramasasstry and Y.S. Rao, J. Phys. E Sci. Instrum., 12, 1023 (1979); https://doi.org/10.1088/0022-3735/12/11/002
- A.S. Chandran, Asian J. Chem., 35, 2131 (2023); https://doi.org/10.14233/ajchem.2023.28096
- G. Juarez-Martinez, A. Chiolerio, P. Allia, M. Poggio, C.L. Degen, L. Zhang, B.J. Nelson, L. Dong, M. Iwamoto, M.J. Buehler, G. Bratzel, F.A. Mohamed, N. Doble, A. Govil, I. Bita, E. Gusev, J.-T. Huang, K.- Y. Lee, H.-J. Hsu, P.-S. Chao, C.-Y. Lin, J. Muthuswamy, M. Okandan, D.P. Butler, Z. Celik-Butler, B. Kim, W.-T. Park, A. Baig, D. Gamzina, J. Zhao, Y. Shin, R. Barchfeld, L.R. Barnett, C. Domier, N.C. Luhmann, Y. Rosen, P. Gurman, C. Snoeyink, S.T. Wereley, R. Ghosh, A. Kumar, P.P. Mukherjee, S. Kim, T. Thundat, A. Gopal, K. Hoshino, J.X. Zhang, T. Ono, M. Esashi, S. Tsuda, R.M. Pocratsky, M.P. Boer, S. Litster,C.W. Padgett, T.S. Whiteside, L. Preziosi, S. Tsuda, M.A. Pasquinelli, Y.G. Yingling, Y. Shi, S.A. Boden, D.M. Bagnall, R.E. Serda and M. Ferrari, Maxwell–Wagner Effect, Encyclopedia of Nanotechnology, Dordrecht: Springer Netherlands, pp. 1276–1285 (2012); https://doi.org/10.1007/978-90-481-9751-4_5
- K.C. Han, H.D. Choi, T.J. Moon, W.S. Kim and K.Y. Kim, J. Mater. Sci., 30, 3567 (1995); https://doi.org/10.1007/BF00351866
- B. Tareev, Physics of Dielectric Materials, Mir Publications: Moscow (1979).
- K. Lichtenecker, Phys. Z., 10, 1005 (1908).
References
A. Bhattacharya and A. De, Prog. Solid State Chem., 24, 141 (1996); https://doi.org/10.1016/0079-6786(96)00002-7
Y. Wang, Int. J. Mater. Res., 105, 1 (2014); https://doi.org/10.3139/146.014012
M. Wen, Y. Zhao, Z. Li, S. Lai, Q. Zeng, C. Liu and Y. Liu, Diamond Related Materials, 111, 108219 (2021); https://doi.org/10.1016/j.diamond.2020.108219
C.H. Chang, M.H. Yun and W.J. Choi, Synth. Met., 145, 1 (2004); https://doi.org/10.1016/j.synthmet.2004.01.012
M. Tabellout, K. Fatyeyeva, P.Y. Baillif, J.F. Bardeau and A.A. Pud, J. Non-Cryst. Solids, 351, 2835 (2005); https://doi.org/10.1016/j.jnoncrysol.2005.04.085
H.C. Pant, M.K. Patra, S.C. Negi, A. Bhatia, S.R. Vadera and N. Kumar, Bull. Mater. Sci., 29, 379 (2006); https://doi.org/10.1007/BF02704139
A. Dey, S. De, A. De and S.K. De, Nanotechnology, 15, 9 (2004); https://doi.org/10.1088/0957-4484/15/9/028
B.K. Sharma, N. Khare, S.K. Dhawan and H.C. Gupta, J. Alloys Compd., 477, 370 (2009); https://doi.org/10.1016/j.jallcom.2008.10.004
J. Joo, S.M. Long, J.P. Pouget, E.J. Oh, A.G. MacDiarmid and A.J. Epstein, Phys. Rev. B Condens. Matter, 57, 9567 (1998); https://doi.org/10.1103/PhysRevB.57.9567
B.K. Sharma, N. Khare, R. Sharma, S.K. Dhawan, V.D. Vankar and H.C. Gupta, Compos. Sci. Technol., 69, 1932 (2009); https://doi.org/10.1016/j.compscitech.2009.04.012
M.G.I. Han and S.S. Im, J. Appl. Polym. Sci., 71, 2169 (1999); https://doi.org/10.1002/(SICI)1097-4628(19990328)71:13<2169:: AID-APP7>3.0.CO;2-P
P. Lv, Y. Zhao, F. Liu, G. Li, X. Dai, X. Ji, Z. Dong and X. Qiu, Appl. Surf. Sci., 367, 335 (2016); https://doi.org/10.1016/j.apsusc.2016.01.181
R. Kannusamy, K. Prem Nazeer, A. Abiram, P. Kolandaivel and A. Ayesha Begam, Int. J. Sci. Humanit., 1, 107 (2015).
M.S. Pinho, M. Dezotti, M.M. Gorelova and B.G. Soares, J. Appl. Polym. Sci., 71, 2329 (1999); https://doi.org/10.1002/(SICI)1097-4628(19990404)71:143.0.CO;2-Y
K. Pielichowski, J. Therm. Anal. Calorim., 54, 171 (1998); https://doi.org/10.1023/A:1010129205138
S. Ameen, V. Ali, M. Zulfequar, M. Mazharul Haq and M. Husain, Physica B, 403, 2861 (2008); https://doi.org/10.1016/j.physb.2008.02.025
J. Bhadra, N.J. Al-Thani, N.K. Madi and M.A. Al-Maadeed, Arab. J. Chem., 10, 664 (2017); https://doi.org/10.1016/j.arabjc.2015.04.017
J. Bhadra, N.K. Madi, N.J. Al-Thani and M.A. Al-Maadeed, Synth. Met., 191, 126 (2014); https://doi.org/10.1016/j.synthmet.2014.03.003
G.P. Joshi and S.M. Pawde, J. Appl. Polym. Sci., 102, 1014 (2006); https://doi.org/10.1002/app.24062
C. Min, X. Shen, Z. Shi, L. Chen and Z. Xu, Polym. Plast. Technol. Eng., 49, 1172 (2010); https://doi.org/10.1080/03602559.2010.496405
V. Siva, D. Vanitha, A. Murugan, A. Shameem and S.A. Bahadur, Compos. Commun., 23, 100597 (2021); https://doi.org/10.1016/j.coco.2020.100597
S. Parida, R.K. Parida, R. Padhee, N.C. Nayak and B.N. Parida, Mater. Sci. Eng. B, 275, 115497 (2022); https://doi.org/10.1016/j.mseb.2021.115497
S. Bhadra, N.K. Singha and D. Khastgir, Curr. Appl. Phys., 9, 396 (2009); https://doi.org/10.1016/j.cap.2008.03.009
E.S. Matveeva, Synth. Met., 79, 127 (1996); https://doi.org/10.1016/0379-6779(96)80180-9
M. Trihotri, U.K. Dwivedi, F.H. Khan, M.M. Malik and M.S. Qureshi, J. Non-Cryst. Solids, 421, 1 (2015); https://doi.org/10.1016/j.jnoncrysol.2015.04.020
S. More, R. Dhokne and S. Moharil, Polym. Bull., 75, 909 (2018); https://doi.org/10.1007/s00289-017-2069-0
A. Dixit and H.S. Mali, J. Compos. Mater., 49, 1 (2013); https://doi.org/10.1007/s11029-013-9316-8
K.P. Ahmad, W. Pan and S.-L. Shi, Appl. Phys. Lett., 89, 133122 (2006); https://doi.org/10.1063/1.2357920
W. Zheng and S.-C. Wong, Compos. Sci. Technol., 63, 225 (2003);
https://doi.org/10.1016/S0266-3538(02)00201-4
A.S. Chandran and S.K. Narayanankutty, Eur. Polym. J., 44, 2418 (2008); https://doi.org/10.1016/j.eurpolymj.2008.05.012
A.S. Chandran and S.K. Narayanankutty, J. Mater. Sci., 24, 8 (2009); https://doi.org/10.1557/jmr.2009.0329
A. Goswami, Thin Film Fundamentals, New Age International (P) Limited Publishers: New Delhi, India (1996).
C. Ramasasstry and Y.S. Rao, J. Phys. E Sci. Instrum., 12, 1023 (1979); https://doi.org/10.1088/0022-3735/12/11/002
A.S. Chandran, Asian J. Chem., 35, 2131 (2023); https://doi.org/10.14233/ajchem.2023.28096
G. Juarez-Martinez, A. Chiolerio, P. Allia, M. Poggio, C.L. Degen, L. Zhang, B.J. Nelson, L. Dong, M. Iwamoto, M.J. Buehler, G. Bratzel, F.A. Mohamed, N. Doble, A. Govil, I. Bita, E. Gusev, J.-T. Huang, K.- Y. Lee, H.-J. Hsu, P.-S. Chao, C.-Y. Lin, J. Muthuswamy, M. Okandan, D.P. Butler, Z. Celik-Butler, B. Kim, W.-T. Park, A. Baig, D. Gamzina, J. Zhao, Y. Shin, R. Barchfeld, L.R. Barnett, C. Domier, N.C. Luhmann, Y. Rosen, P. Gurman, C. Snoeyink, S.T. Wereley, R. Ghosh, A. Kumar, P.P. Mukherjee, S. Kim, T. Thundat, A. Gopal, K. Hoshino, J.X. Zhang, T. Ono, M. Esashi, S. Tsuda, R.M. Pocratsky, M.P. Boer, S. Litster,C.W. Padgett, T.S. Whiteside, L. Preziosi, S. Tsuda, M.A. Pasquinelli, Y.G. Yingling, Y. Shi, S.A. Boden, D.M. Bagnall, R.E. Serda and M. Ferrari, Maxwell–Wagner Effect, Encyclopedia of Nanotechnology, Dordrecht: Springer Netherlands, pp. 1276–1285 (2012); https://doi.org/10.1007/978-90-481-9751-4_5
K.C. Han, H.D. Choi, T.J. Moon, W.S. Kim and K.Y. Kim, J. Mater. Sci., 30, 3567 (1995); https://doi.org/10.1007/BF00351866
B. Tareev, Physics of Dielectric Materials, Mir Publications: Moscow (1979).
K. Lichtenecker, Phys. Z., 10, 1005 (1908).