Copyright (c) 2022 AJC
This work is licensed under a Creative Commons Attribution 4.0 International License.
Electrochemical Activation of Nickel Oxide Incorporated Aluminum-Zinc Alloy Matrix as an Efficient Sacrificial Anode in Marine Environments
Corresponding Author(s) : K.K. Binoj
Asian Journal of Chemistry,
Vol. 34 No. 4 (2022): Vol 34 Issue 4, 2022
Abstract
For cathodic protection of steel, the aluminium-zinc alloy sacrificial anodes incorporated with nickel oxide nanoparticles were fabricated. The metallurgical properties of Al-Zn sacrificial anodes enhanced substantially through the infiltration and uniform dispersion of nickel oxide nanoparticles into an Al-Zn matrix. Such effective and uniform presence of nano nickel oxide inside the interior mass of the anodes was characterized by electrochemical techniques. The anodes showed considerably low polarization, steady and high active open circuit potential and substantially decreased self-corrosion during galvanic exposure for prolonged periods. The presence of nickel oxide nanoparticles in the anode matrix caused effective destruction of the passive aluminia film, which facilitated enrichment of galvanic performance of the anode. The anode had high resistance against biofouling also.
Keywords
Download Citation
Endnote/Zotero/Mendeley (RIS)BibTeX
- A. Barbucci, P.L. Cabot, G. Bruzzone and G. Cerisola, J. Alloys Compd., 268, 295 (1998); https://doi.org/10.1016/S0925-8388(97)00605-1
- D.O. Flamini, S.B. Saidman and J.B. Bessone, Thin Solid Films, 515, 7880 (2007); https://doi.org/10.1016/j.tsf.2007.04.016
- J.B. Bessone, D.O. Flamini and S.B. Saidman, Corros. Sci., 47, 95 (2005); https://doi.org/10.1016/j.corsci.2004.05.002
- A.G. Munoz, S.B. Saidman and J.B. Bessone, Corros. Sci., 44, 2171 (2002); https://doi.org/10.1016/S0010-938X(02)00042-2
- S.M.A. Shibli, B. Jabeera and R. Manu, Mater. Lett., 61, 3000 (2007); https://doi.org/10.1016/j.matlet.2006.10.062
- S.M.A. Shibli, V.S. Dilimon and V.S. Saji, J. Solid State Electrochem., 11, 201 (2006); https://doi.org/10.1007/s10008-005-0088-5
- S.M.A. Shibli and K.K. Binoj, J. Appl. Electrochem., 39, 159 (2009); https://doi.org/10.1007/s10800-008 9659-3
- P.M. Ashraf and S.M.A. Shibli, Electrochem. Commun., 9, 443 (2007); https://doi.org/10.1016/j.elecom.2006.09.010.
- B. Jabeera, T.S. Anirudhan and S.M.A. Shibli, J. New Mater. Electrochem. Syst., 8, 291 (2005).
- Y. Wang, J. Zhu, X. Yang, L. Lu and X. Wang, Thermochim. Acta, 437, 106 (2005); https://doi.org/10.1016/j.tca.2005.06.027
- C. Shi, G. Wang, N. Zhao, X. Du and J. Li, Chem. Phys. Lett., 454, 75 (2008); https://doi.org/10.1016/j.cplett.2008.01.069
- X. Xin, Z. Lü, B. Zhou, X. Huang, R. Zhu, X. Sha, Y. Zhang and W. Su, J. Alloys Compd., 427, 251 (2007); https://doi.org/10.1016/j.jallcom.2006.02.064
- L. Xiang, X.Y. Deng and Y. Jin, Scr. Mater., 47, 219 (2002); https://doi.org/10.1016/S1359 6462(02)00108-2
- S.M.A. Shibli, K.S. Beenakumari and N.D. Suma, Biosens. Bioelectron., 22, 633 (2006); https://doi.org/10.1016/j.bios.2006.01.020
- P. Poizot, S. Laruelle, S. Grugeon, L. Dupont and J.-M. Tarascon, Nature, 407, 496 (2000); https://doi.org/10.1038/35035045
- X. Wang, J. Song, L. Gao, J. Jin, H. Zheng and Z. Zhang, Nanotechnology, 16, 37 (2005); https://doi.org/10.1088/0957-4484/16/1/009
- S. Illy-Cherrey, O. Tillement, J.M. Dubois, F. Massicot, Y. Fort, J. Ghanbaja and S. Bégin-Colin, J. Mater. Sci. Eng. A, 338, 70 (2002); https://doi.org/10.1016/S0921-5093(02)00057-6
- D.S. Wang, R. Xu, X. Wang and Y.D. Li, Nanotechnology, 17, 979 (2006); https://doi.org/10.1088/0957-4484/17/4/023
- M.T. Reetz, W. Helbig, S.A. Quaiser, U. Stimming, N. Breuer and R. Vogel, Science, 267, 367 (1995); https://doi.org/10.1126/science.267.5196.367
- X. Deng and Z. Chen, Mater. Lett., 58, 276 (2004) ; https://doi.org/10.1016/S0167-577X(03)00469-5
- D.-L. Sun, B.-W. Zhao, J.-B. Liu, H. Wang and H. Yan, Ionics, 23, 1509 (2017); https://doi.org/10.1007/s11581-017-1974-4
- H. Sina, M. Emamy, M. Saremi, A. Keyvani, M. Mahta and J. Campbell, J. Mater. Sci. Eng. A, 431, 263 (2006); https://doi.org/10.1016/j.msea.2006.06.011
- S.Z. Abedin and F. Endres, J. Appl. Electrochem., 34, 1071 (2004); https://doi.org/10.1023/B:JACH.0000042672.23588.df
- M.A. Talavera, S. Valdez, J.A. Juarez-Islas, B. Mena and J. Genesca, J. Appl. Electrochem., 32, 897 (2002); https://doi.org/10.1023/A:1020547508321
- D.R. Salinas, S.G. Garcia and J.B. Bessone, J. Appl. Electrochem., 29, 1063 (1999); https://doi.org/10.1023/A:1003684219989
- A. Venugopal and V.S. Raja, Corros. Sci., 39, 2053 (1997); https://doi.org/10.1016/S0010 938X(97)00082-6
- S.M.A. Shibli and S. George, Appl. Surf. Sci., 253, 7510 (2007); https://doi.org/10.1016/j.apsusc.2007.03.052
- J.H.W. de Wit and H.J.W. Lenderink, Electrochim. Acta, 41, 1111 (1996); https://doi.org/10.1016/0013-4686(95)00462-9
- L. Bai and B.E. Conway, Electrochim. Acta, 38, 1803 (1993); https://doi.org/10.1016/0013-4686(93)80302-G
- J.B. Bessone, D.R. Salinas, C.E. Mayer, M. Ebert and W.J. Lorenz, Electrochim. Acta, 37, 2283 (1992); https://doi.org/10.1016/0013-4686(92)85124-4
References
A. Barbucci, P.L. Cabot, G. Bruzzone and G. Cerisola, J. Alloys Compd., 268, 295 (1998); https://doi.org/10.1016/S0925-8388(97)00605-1
D.O. Flamini, S.B. Saidman and J.B. Bessone, Thin Solid Films, 515, 7880 (2007); https://doi.org/10.1016/j.tsf.2007.04.016
J.B. Bessone, D.O. Flamini and S.B. Saidman, Corros. Sci., 47, 95 (2005); https://doi.org/10.1016/j.corsci.2004.05.002
A.G. Munoz, S.B. Saidman and J.B. Bessone, Corros. Sci., 44, 2171 (2002); https://doi.org/10.1016/S0010-938X(02)00042-2
S.M.A. Shibli, B. Jabeera and R. Manu, Mater. Lett., 61, 3000 (2007); https://doi.org/10.1016/j.matlet.2006.10.062
S.M.A. Shibli, V.S. Dilimon and V.S. Saji, J. Solid State Electrochem., 11, 201 (2006); https://doi.org/10.1007/s10008-005-0088-5
S.M.A. Shibli and K.K. Binoj, J. Appl. Electrochem., 39, 159 (2009); https://doi.org/10.1007/s10800-008 9659-3
P.M. Ashraf and S.M.A. Shibli, Electrochem. Commun., 9, 443 (2007); https://doi.org/10.1016/j.elecom.2006.09.010.
B. Jabeera, T.S. Anirudhan and S.M.A. Shibli, J. New Mater. Electrochem. Syst., 8, 291 (2005).
Y. Wang, J. Zhu, X. Yang, L. Lu and X. Wang, Thermochim. Acta, 437, 106 (2005); https://doi.org/10.1016/j.tca.2005.06.027
C. Shi, G. Wang, N. Zhao, X. Du and J. Li, Chem. Phys. Lett., 454, 75 (2008); https://doi.org/10.1016/j.cplett.2008.01.069
X. Xin, Z. Lü, B. Zhou, X. Huang, R. Zhu, X. Sha, Y. Zhang and W. Su, J. Alloys Compd., 427, 251 (2007); https://doi.org/10.1016/j.jallcom.2006.02.064
L. Xiang, X.Y. Deng and Y. Jin, Scr. Mater., 47, 219 (2002); https://doi.org/10.1016/S1359 6462(02)00108-2
S.M.A. Shibli, K.S. Beenakumari and N.D. Suma, Biosens. Bioelectron., 22, 633 (2006); https://doi.org/10.1016/j.bios.2006.01.020
P. Poizot, S. Laruelle, S. Grugeon, L. Dupont and J.-M. Tarascon, Nature, 407, 496 (2000); https://doi.org/10.1038/35035045
X. Wang, J. Song, L. Gao, J. Jin, H. Zheng and Z. Zhang, Nanotechnology, 16, 37 (2005); https://doi.org/10.1088/0957-4484/16/1/009
S. Illy-Cherrey, O. Tillement, J.M. Dubois, F. Massicot, Y. Fort, J. Ghanbaja and S. Bégin-Colin, J. Mater. Sci. Eng. A, 338, 70 (2002); https://doi.org/10.1016/S0921-5093(02)00057-6
D.S. Wang, R. Xu, X. Wang and Y.D. Li, Nanotechnology, 17, 979 (2006); https://doi.org/10.1088/0957-4484/17/4/023
M.T. Reetz, W. Helbig, S.A. Quaiser, U. Stimming, N. Breuer and R. Vogel, Science, 267, 367 (1995); https://doi.org/10.1126/science.267.5196.367
X. Deng and Z. Chen, Mater. Lett., 58, 276 (2004) ; https://doi.org/10.1016/S0167-577X(03)00469-5
D.-L. Sun, B.-W. Zhao, J.-B. Liu, H. Wang and H. Yan, Ionics, 23, 1509 (2017); https://doi.org/10.1007/s11581-017-1974-4
H. Sina, M. Emamy, M. Saremi, A. Keyvani, M. Mahta and J. Campbell, J. Mater. Sci. Eng. A, 431, 263 (2006); https://doi.org/10.1016/j.msea.2006.06.011
S.Z. Abedin and F. Endres, J. Appl. Electrochem., 34, 1071 (2004); https://doi.org/10.1023/B:JACH.0000042672.23588.df
M.A. Talavera, S. Valdez, J.A. Juarez-Islas, B. Mena and J. Genesca, J. Appl. Electrochem., 32, 897 (2002); https://doi.org/10.1023/A:1020547508321
D.R. Salinas, S.G. Garcia and J.B. Bessone, J. Appl. Electrochem., 29, 1063 (1999); https://doi.org/10.1023/A:1003684219989
A. Venugopal and V.S. Raja, Corros. Sci., 39, 2053 (1997); https://doi.org/10.1016/S0010 938X(97)00082-6
S.M.A. Shibli and S. George, Appl. Surf. Sci., 253, 7510 (2007); https://doi.org/10.1016/j.apsusc.2007.03.052
J.H.W. de Wit and H.J.W. Lenderink, Electrochim. Acta, 41, 1111 (1996); https://doi.org/10.1016/0013-4686(95)00462-9
L. Bai and B.E. Conway, Electrochim. Acta, 38, 1803 (1993); https://doi.org/10.1016/0013-4686(93)80302-G
J.B. Bessone, D.R. Salinas, C.E. Mayer, M. Ebert and W.J. Lorenz, Electrochim. Acta, 37, 2283 (1992); https://doi.org/10.1016/0013-4686(92)85124-4