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This work is licensed under a Creative Commons Attribution 4.0 International License.
Fabrication of Vanadium Doped Zinc Oxide Thin Film to Enhance the Optical, Magnetic and Electrical Properties using Electrospray Technique
Corresponding Author(s) : A. Manivasaham
Asian Journal of Chemistry,
Vol. 33 No. 10 (2021): Vol 33 Issue 10, 2021
Abstract
Vanadium doped zinc oxide was deposited using a homemade electrospray technique. The structural, optical, magnetic, surface morphology and electrical studies were carried out using XRD, UV-vis-NIR spectroscopy, HRSEM, AFM, photoluminescence, VSM and Hall effect, respectively. The XRD results revealed that the addition of vanadium(V) does not affect hexagonal wurtzite structure in the films. Photoluminescence study implies the increase of oxygen vacancy on surface of the samples and the hexagonal plates like grains are found on the film surface and formation of cluster as doping percentage increases. Hall effect shows the remarkable improvement in carrier concentration, resistivity and mobility. The sheet resistance decreases to 59.5 × 102 Ω/2 for 4 at% of vanadium. All the samples achieved the transmittance above 80% in the visible region and optical band gap increases. The magnetic study shows that the enhancement of paramagnetic property and the study on the performances of the samples over the light intensity shows, the enhancement in the rate of decreases in resistance, which is higher than the undoped sample ware discussed.
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References
W. Liu and H. Wang, J. Materiomics, 6, 385 (2020); https://doi.org/10.1016/j.jmat.2019.12.006
C.T. Pan, Y.C. Chen, C.C. Hsieh, C.H. Lin, C.Y. Su, C.K. Yen, Z.H. Liu and W.C. Wang, Sens. Actuators A Phys., 216, 318 (2014); https://doi.org/10.1016/j.sna.2014.05.024
Y. Liu, Y. Li and H. Zeng, J. Nanomater., 2013, 196521 (2013); https://doi.org/10.1155/2013/196521
T. Maruyama and J. Shionoya, J. Mater. Sci. Lett., 11, 170 (1992); https://doi.org/10.1007/BF00724682
M. Thirumoorthi and J.T.J. Prakash, Mater. Sci. Eng. B, 248, 114402 (2019); https://doi.org/10.1016/j.mseb.2019.114402
A. Smaali, S. Abdelli-Messaci, S. Lafane, A. Mavlonov, J. Lenzner, S. Richter, M. Kechouane, O. Nemraoui and K. Ellmer, Thin Solid Films, 700, 137892 (2020); https://doi.org/10.1016/j.tsf.2020.137892
B.G. Shohany and A.K. Zak, Ceram. Int., 46, 5507 (2020); https://doi.org/10.1016/j.ceramint.2019.11.051
A. Renitta and K. Vijayalakshmi, Sens. Actuators B Chem., 237, 912 (2016); https://doi.org/10.1016/j.snb.2016.07.017
C.M. Mahajan and M.G. Takwale, J. Alloys Compd., 584, 128 (2014); https://doi.org/10.1016/j.jallcom.2013.08.136
Z.N. Kayani, H. Nazli, S. Kousar, S. Riaz and S. Naseem, Ceram. Int., 46, 14605 (2020); https://doi.org/10.1016/j.ceramint.2020.02.261
K. Ravichandran, E. Sindhuja, R. Uma and T. Arun, Surf. Eng., 33, 512 (2017); https://doi.org/10.1080/02670844.2016.1270797
D.-H. Xia, J. Wang, Z. Qin, Z. Gao, Z. Wu, J. Wang, L. Yang, W. Hu and J.-L. Luo, Mater. Chem. Phys., 233, 133 (2019); https://doi.org/10.1016/j.matchemphys.2019.05.056
A. Jaworek and A.T. Sobczyk, J. Electrost., 66, 197 (2008); https://doi.org/10.1016/j.elstat.2007.10.001
K. Ravichandran, K. Subha, N. Dineshbabu and A. Manivasaham, J. Alloys Compd., 656, 332 (2016); https://doi.org/10.1016/j.jallcom.2015.09.115
Q. Fan, D. Li, J. Li and C. Wang, J. Alloys Compd., 829, 154483 (2020); https://doi.org/10.1016/j.jallcom.2020.154483
K. Ravichandran, M. Vasanthi, K. Thirumurugan, K. Karthika and B. Sakthivel, J. Mater. Sci. Mater. Electron., 26, 5451 (2015); https://doi.org/10.1007/s10854-015-3101-5
T. Prasada Rao, M.C. Santhosh Kumar, A. Safarulla, V. Ganesan, S.R. Barman and C. Sanjeeviraja, Physica B, 405, 2226 (2010); https://doi.org/10.1016/j.physb.2010.02.016
F.Z. Bedia, A. Bedia, N. Maloufi, M. Aillerie, F. Genty and B. Benyoucef, J. Alloys Compd., 616, 312 (2014); https://doi.org/10.1016/j.jallcom.2014.07.086
A.S.H. Hameed, C. Karthikeyan, S. Sasikumar, V. Senthil Kumar, S Kumaresan and G. Ravi, J. Mater. Chem. B, 1, 5950 (2013); https://doi.org/10.1039/C3TB21068E
Y. Wang, Z.J. Peng, Q. Wang and X.L. Fu, Surf. Eng., 33, 217 (2017); https://doi.org/10.1080/02670844.2016.1212519
R. Mimouni, K. Boubaker and M. Amlouk, J. Alloys Compd., 624, 189 (2015); https://doi.org/10.1016/j.jallcom.2014.11.016
R. Mariappan, V. Ponnuswamy, A. Chandra Bose, A. Chithambararaj, R. Suresh and M. Ragavendar, Superlatt. Microstruct., 65, 184 (2014); https://doi.org/10.1016/j.spmi.2013.10.005
T. Suzuki, H. Chiba, T. Kawashima and K. Washio, Thin Solid Films, 605, 53 (2016); https://doi.org/10.1016/j.tsf.2015.11.064
M. Al-Hashem, S. Akbar and P. Morris, Sens. Actuators B Chem., 301, 126845 (2019); https://doi.org/10.1016/j.snb.2019.126845
A. Paulson, N.A.M. Sabeer and P.P. Pradyumnan, Mater. Sci. Eng. B, 262, 114745 (2020); https://doi.org/10.1016/j.mseb.2020.114745
N. Al-Hardan, M.J. Abdullah and A.A. Aziz, Appl. Surf. Sci., 257, 8993 (2011); https://doi.org/10.1016/j.apsusc.2011.05.078
V. Srivastava and K. Jain, RSC Adv., 5, 56993 (2015); https://doi.org/10.1039/C5RA11050E
C. Cachoncinlle, C. Hebert, J. Perriere, M. Nistor, A. Petit and E. Millon, Appl. Surf. Sci., 336, 103 (2015); https://doi.org/10.1016/j.apsusc.2014.09.186
O. Gurbuz and M. Okutan, Appl. Surf. Sci., 387, 1211 (2016); https://doi.org/10.1016/j.apsusc.2016.06.114
R.K. Upadhyay and L.A. Kumaraswamidhas, Surf. Eng., 32, 289 (2016); https://doi.org/10.1179/1743294415Y.0000000109
A. Goktas, I.H. Mutlu and Y. Yamada, Superlatt. Microstruct., 57, 139 (2013); https://doi.org/10.1016/j.spmi.2013.02.010
G. Shanmuganathan and I.B. Shameem Banu, Superlatt. Microstruct., 75, 879 (2014); https://doi.org/10.1016/j.spmi.2014.08.024
S. Ghosh, G.G. Khan, A. Ghosh, S. Varma and K. Mandal, CrystEngComm, 15, 7748 (2013); https://doi.org/10.1039/c3ce40717a
M. Fitta, H. Prima-Garcia, P. Czaja, T. Korzeniak, M. Krupinski, M. Wojtyniak and M. Ba³anda, RSC Adv., 7, 1382 (2017); https://doi.org/10.1039/C6RA25775E