Copyright (c) 2015 AJC
This work is licensed under a Creative Commons Attribution 4.0 International License.
A Facile Fast Fourier Transforms Method for Characterization of Nanoporous Templates
Corresponding Author(s) : Lingjie Li
Asian Journal of Chemistry,
Vol. 27 No. 11 (2015): Vol 27 Issue 11
Abstract
High-quality nanoporous templates play an important role in nanomaterials. However, it is difficult to quantitatively evaluate the quality of nanotemplates. In this work, a method based on image processing technology and frequency-domain analysis method is proposed. The geometric parameters of templates including porosity, diameters are extracted. To evaluate the pores ordering, two parameters, the characteristic angle and peak-peak ratio are proposed by combining two-dimensional fast Fourier transforms (2-D FFT) and 1-D fast Fourier transforms techniques. According to the parameters, the lattice type and the pores ordering can be inferred. The accuracy and reliability of present method have been verified by analyzing a standard test image. After that, the quality of some anodic aluminum oxide templates is effectively assessed. The results show this method provides a facile, reliable and comprehensive approach to evaluate the quality of nanoporous templates, which is helpful to optimize the preparation technology and to prepare high-performance functional nanomaterials.
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- F.I. Dar, S. Habouti, R. Minch, M. Dietze and M. Es-Souni, J. Mater. Chem., 22, 8671 (2012); doi:10.1039/c2jm16826j.
- J.J. Li and L.T. Zhang, Asian J. Chem., 24, 4130 (2012).
- Z.Y. Zeng, X. Huang, Z.Y. Yin, H. Li, Y. Chen, H. Li, Q. Zhang, J. Ma, F. Boey and H. Zhang, Adv. Mater., 24, 4138 (2012); doi:10.1002/adma.201104281.
- B. Sun, Y.Z. Hao, F. Guo, Y.H. Cao, Y.H. Zhang, Y.P. Li and D.S. Xu, J. Phys. Chem. C, 116, 1395 (2012); doi:10.1021/jp206067m.
- D. Xu, X.H. Yan, P. Diao and P.G. Yin, J. Phys. Chem. C, 118, 9758 (2014); doi:10.1021/jp500667f.
- A. Huczko, Appl. Phys., A Mater. Sci. Process., 70, 365 (2000); doi:10.1007/s003390051050.
- W. Lee and S. Park, Chem. Rev., 114, 7487 (2014); doi:10.1021/cr500002z.
- J.J. Li, J.B. Zhang, L.T. Zhang, Y. Liu and W.C. Hao, Asian J. Chem., 25, 6173 (2013); doi:10.14233/ajchem.2013.14300.
- X.W. Kang and S.W. Chen, J. Mater. Sci., 45, 2696 (2010); doi:10.1007/s10853-010-4254-5.
- Y.C. Liu and K.Y. Xie, Sci. Adv. Mater., 6, 863 (2014); doi:10.1166/sam.2014.1748.
- J.K. Chang, S.H. Hsu, W.T. Tsai and I.W. Sun, J. Power Sources, 177, 676 (2008); doi:10.1016/j.jpowsour.2007.11.039.
- D.Y. Ding, Z. Chen, S. Rajaputra and V. Singh, Sens. Actuators B, 124, 12 (2007); doi:10.1016/j.snb.2006.11.034.
- G.E. Thompson, Thin Solid Films, 297, 192 (1997); doi:10.1016/S0040-6090(96)09440-0.
- N. Hassanzadeh, H. Omidvar, M. Poorbafrani and S.H. Tabaian, Arab J. Sci. Eng., 38, 1305 (2013); doi:10.1007/s13369-013-0593-2.
- R. Hillebrand, F. Muller, K. Schwirn, W. Lee and M. Steinhart, ACS Nano, 2, 913 (2008); doi:10.1021/nn700318v.
- A.C. Johnston-Peck, J. Wang and J.B. Tracy, Langmuir, 27, 5040 (2011); doi:10.1021/la200005q.
- M.J. Abdollahifard, K. Faez, M. Pourfard and M. Abdollahi, Appl. Surf. Sci., 257, 10443 (2011); doi:10.1016/j.apsusc.2011.06.139.
- M. Pourfard, K. Faez and S.H. Tabaian, J. Phys. Chem. C, 117, 17225 (2013); doi:10.1021/jp401504q.
- J.R. Borba, C. Brito, P. Migowski, T.B. Vale, D.A. Stariolo, S.R. Teixeira and A.F. Feil, J. Phys. Chem. C, 117, 246 (2013); doi:10.1021/jp308542d.
- L. Zaraska, G.D. Sulka, J. Szeremeta and M. Jaskula, Electrochim. Acta, 55, 4377 (2010); doi:10.1016/j.electacta.2009.12.054.
- M.H. Rahimi, S.H. Tabaian, S.P.H. Marashi, S. Saramad, M. Arab and A. Hemasian, Micro & Nano Lett., 7, 125 (2012); doi:10.1049/mnl.2011.0599.
- R.C. Gonzalez, R.E. Woods and S.L. Eddins, Digital Image Processing Using Matlab, edn 4, Prentice Hall Publisher, New York (2004).
- E. Aubert and C. Lecomte, J. Appl. Cryst., 40, 1153 (2007); doi:10.1107/S0021889807043622.
- X.Y. Su and W.J. Chen, Opt. Lasers Eng., 35, 263 (2001); doi:10.1016/S0143-8166(01)00023-9.
- R.C. Gonzalez and R.E. Woods, Digital Image Processing, edn 2, Prentice Hall, New York (2002).
- I. Amidror, Mastering the Discrete Fourier Transform in One, Two or Several Dimensions, edn 1, Springer London Ltd, England (2013).
- G.L. Zhang, L.X. Jin, P. Zheng, W. Wang and X.-J. Wen, Chinese J. Polym. Sci., 31, 798 (2013); doi:10.1007/s10118-013-1273-0.
- K.S. Napolskii, I.V. Roslyakov, A.A. Eliseev, A.V. Petukhov, D.V. Byelov, N.A. Grigoryeva, W.G. Bouwman, A.V. Lukashin, K.O. Kvashnina, A.P. Chumakov and S.V. Grigoriev, J. Appl. Cryst., 43, 531 (2010); doi:10.1107/S0021889810009131.
- H. Masuda, F. Hasegawa and S. Ono, J. Electrochem. Soc., 144, L127 (1997); doi:10.1149/1.1837634.
- H. Masuda, H. Asoh, M. Watanabe, K. Nishio, M. Nakao and T. Tamamura, Adv. Mater., 13, 189 (2001); doi:10.1002/1521-4095(200102)13:3<189::AID-ADMA189>3.0.CO;2-Z.
References
F.I. Dar, S. Habouti, R. Minch, M. Dietze and M. Es-Souni, J. Mater. Chem., 22, 8671 (2012); doi:10.1039/c2jm16826j.
J.J. Li and L.T. Zhang, Asian J. Chem., 24, 4130 (2012).
Z.Y. Zeng, X. Huang, Z.Y. Yin, H. Li, Y. Chen, H. Li, Q. Zhang, J. Ma, F. Boey and H. Zhang, Adv. Mater., 24, 4138 (2012); doi:10.1002/adma.201104281.
B. Sun, Y.Z. Hao, F. Guo, Y.H. Cao, Y.H. Zhang, Y.P. Li and D.S. Xu, J. Phys. Chem. C, 116, 1395 (2012); doi:10.1021/jp206067m.
D. Xu, X.H. Yan, P. Diao and P.G. Yin, J. Phys. Chem. C, 118, 9758 (2014); doi:10.1021/jp500667f.
A. Huczko, Appl. Phys., A Mater. Sci. Process., 70, 365 (2000); doi:10.1007/s003390051050.
W. Lee and S. Park, Chem. Rev., 114, 7487 (2014); doi:10.1021/cr500002z.
J.J. Li, J.B. Zhang, L.T. Zhang, Y. Liu and W.C. Hao, Asian J. Chem., 25, 6173 (2013); doi:10.14233/ajchem.2013.14300.
X.W. Kang and S.W. Chen, J. Mater. Sci., 45, 2696 (2010); doi:10.1007/s10853-010-4254-5.
Y.C. Liu and K.Y. Xie, Sci. Adv. Mater., 6, 863 (2014); doi:10.1166/sam.2014.1748.
J.K. Chang, S.H. Hsu, W.T. Tsai and I.W. Sun, J. Power Sources, 177, 676 (2008); doi:10.1016/j.jpowsour.2007.11.039.
D.Y. Ding, Z. Chen, S. Rajaputra and V. Singh, Sens. Actuators B, 124, 12 (2007); doi:10.1016/j.snb.2006.11.034.
G.E. Thompson, Thin Solid Films, 297, 192 (1997); doi:10.1016/S0040-6090(96)09440-0.
N. Hassanzadeh, H. Omidvar, M. Poorbafrani and S.H. Tabaian, Arab J. Sci. Eng., 38, 1305 (2013); doi:10.1007/s13369-013-0593-2.
R. Hillebrand, F. Muller, K. Schwirn, W. Lee and M. Steinhart, ACS Nano, 2, 913 (2008); doi:10.1021/nn700318v.
A.C. Johnston-Peck, J. Wang and J.B. Tracy, Langmuir, 27, 5040 (2011); doi:10.1021/la200005q.
M.J. Abdollahifard, K. Faez, M. Pourfard and M. Abdollahi, Appl. Surf. Sci., 257, 10443 (2011); doi:10.1016/j.apsusc.2011.06.139.
M. Pourfard, K. Faez and S.H. Tabaian, J. Phys. Chem. C, 117, 17225 (2013); doi:10.1021/jp401504q.
J.R. Borba, C. Brito, P. Migowski, T.B. Vale, D.A. Stariolo, S.R. Teixeira and A.F. Feil, J. Phys. Chem. C, 117, 246 (2013); doi:10.1021/jp308542d.
L. Zaraska, G.D. Sulka, J. Szeremeta and M. Jaskula, Electrochim. Acta, 55, 4377 (2010); doi:10.1016/j.electacta.2009.12.054.
M.H. Rahimi, S.H. Tabaian, S.P.H. Marashi, S. Saramad, M. Arab and A. Hemasian, Micro & Nano Lett., 7, 125 (2012); doi:10.1049/mnl.2011.0599.
R.C. Gonzalez, R.E. Woods and S.L. Eddins, Digital Image Processing Using Matlab, edn 4, Prentice Hall Publisher, New York (2004).
E. Aubert and C. Lecomte, J. Appl. Cryst., 40, 1153 (2007); doi:10.1107/S0021889807043622.
X.Y. Su and W.J. Chen, Opt. Lasers Eng., 35, 263 (2001); doi:10.1016/S0143-8166(01)00023-9.
R.C. Gonzalez and R.E. Woods, Digital Image Processing, edn 2, Prentice Hall, New York (2002).
I. Amidror, Mastering the Discrete Fourier Transform in One, Two or Several Dimensions, edn 1, Springer London Ltd, England (2013).
G.L. Zhang, L.X. Jin, P. Zheng, W. Wang and X.-J. Wen, Chinese J. Polym. Sci., 31, 798 (2013); doi:10.1007/s10118-013-1273-0.
K.S. Napolskii, I.V. Roslyakov, A.A. Eliseev, A.V. Petukhov, D.V. Byelov, N.A. Grigoryeva, W.G. Bouwman, A.V. Lukashin, K.O. Kvashnina, A.P. Chumakov and S.V. Grigoriev, J. Appl. Cryst., 43, 531 (2010); doi:10.1107/S0021889810009131.
H. Masuda, F. Hasegawa and S. Ono, J. Electrochem. Soc., 144, L127 (1997); doi:10.1149/1.1837634.
H. Masuda, H. Asoh, M. Watanabe, K. Nishio, M. Nakao and T. Tamamura, Adv. Mater., 13, 189 (2001); doi:10.1002/1521-4095(200102)13:3<189::AID-ADMA189>3.0.CO;2-Z.