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Preparation and Characterization of Copper Doped Cd0.7Zn0.3S Thin Film and Evaluation of Doping Effect of Copper
Corresponding Author(s) : T. Saravana Kumaran
Asian Journal of Chemistry,
Vol. 29 No. 4 (2017): Vol 29 Issue 4
Abstract
Cd0.7Zn0.3S was doped for different mol % of Cu was prepared by chemically deposited technique. The film has been characterized by X-ray diffraction, scanning electron microscope, energy dispersive spectroscopy and ultra violet spectroscopy. The result of X-ray diffraction showed that the films are polycrystalline in nature with a hexagonal structure. SEM studies revealed the size of the sphere increases initially with the increase in Cu concentration. The presence of elemental constituent has been confirmed by energy dispersive X-ray analysis. Results obtained from optical studies showed that the band gap energy varied from 4.650 to 3.265 eV, which confirmed the decrease of band gap with increase in the concentration of Cu on Cd0.7Zn0.3S.
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