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Structural, Dielectric and Electrical Properties of (1-x)CaCu3Ti4O12−xBaTiO3 Ceramics
Corresponding Author(s) : M. Zouhairi
Asian Journal of Chemistry,
Vol. 29 No. 8 (2017): Vol 29 Issue 8
Abstract
In this work, the effect of BaTiO3 (BT) addition on structural, dielectric and electrical properties of CaCu3Ti4O12 (CCTO) ceramic was investigated. Ceramic samples with the chemical formula (1-x)CaCu3Ti4O12 – xBaTiO3, (1-x)CCTO-xBT, (x = 0.00, 0.10, 0.20, 0.30, 0.50 and 1.00) were synthesized by solid state route. The structural studies carried out by X-ray diffraction technique and showed that the perovskite structure cubic and tetragonal phases were formed without any other impurity phases. The addition of BaTiO3 into CCTO system lowered the last crystallite size to about 52 nm and increased the dielectric constant by four orders compared to pure CCTO. Moreover, the results of the complex impedance analyses of (1-x)CCTO–xBT ceramics samples confirmed the presence of non-Debye type of relaxation phenomenon and exhibited a negative temperature coefficient of resistance behaviour.
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- L. Singh, S.U. Rai, K.D. Mandal, B.C. Sin, H. Lee, H. Chung and Y. Lee, Mater. Charact., 96, 54 (2014); https://doi.org/10.1016/j.matchar.2014.07.019.
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- E.J.J. Mallmann, M.A.S. Silva, A.S.B. Sombra, M.A. Botelho, S.E. Mazzetto, A.S. de Menezes, A.F.L. Almeida and P.B.A. Fechine, J. Electr. Mater., 44, 295 (2015); https://doi.org/10.1007/s11664-014-3464-z.
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References
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A. Chamola, H. Singh and U. C. Naithani, Adv. Mater. Lett., 2, 148 (2011); https://doi.org/10.5185/amlett.2010.11183.
A.F.L. Almeida, P.B.A. Fechine, M.P.F. Graça, M.A. Valente and A.S.B. Sombra, J. Mater. Sci. Mater. Electron., 20, 163 (2009); https://doi.org/10.1007/s10854-008-9675-4.
P. Fiorenza, V. Raineri, S.G. Ebbinghaus and R.L. Nigro, CrystEngComm, 13, 3900 (2011); https://doi.org/10.1039/C0CE00948B.
L. Singh, U.S. Rai, K.D. Mandal and N.B. Singh, Prog. Cryst. Growth Charact. Mater., 60, 15 (2014); https://doi.org/10.1016/j.pcrysgrow.2014.04.001.
V.S. Saji and H.C. Choe, Thin Solid Films, 517, 3896 (2009); https://doi.org/10.1016/j.tsf.2009.01.100.
Ajay Pratap Singh. et al., 3, 247 (2014) (Name of the Journal missing)
S. Jesurani, S. Kanagesan, R. Velmurugan and T. Kalaivani, Trans. Indian Ceram. Soc., 70, 79 (2011); https://doi.org/10.1080/0371750X.2011.10600152.
S.A. Ellyawan, Ph.D. Thesis, Bulk and Grain Boundary Electrical Behaviours in Nb and Sn Doped Calcium Copper Titanium Oxide, University of Manchester, UK (2014).
J. Liu, R.W. Smith and W.-N. Mei, Chem. Mater., 19, 6020 (2007); https://doi.org/10.1021/cm0716553.
T. Badapanda, R. Harichandan, S. Nayak, A. Mishra and S. Anwar, Process. Appl. Ceram., 8, 145 (2014); https://doi.org/10.2298/PAC1403145B.
W. Li and R.W. Schwartz, Appl. Phys. Lett., 89, 242906 (2006); https://doi.org/10.1063/1.2405382.
P.R. Bueno, W.C. Ribeiro, M.A. Ramírez, J.A. Varela and E. Longo, Appl. Phys. Lett., 90, 142912 (2007); https://doi.org/10.1063/1.2720301.
R. Schmidt, C.M. Stennett, C.N. Hyatt, J. Pokorny, J. Prado-Gonjal, M. Li and C.D. Sinclair, J. Eur. Ceram. Soc., 32, 3313 (2012); https://doi.org/10.1016/j.jeurceramsoc.2012.03.040.
A. Tselev, M.C. Brooks, M.S. Anlage, H. Zheng, L. Salamanca-Riba, R. Ramesh and M.A. Subramanian, Phys. Rev. B, 70, 144101 (2004); https://doi.org/10.1103/PhysRevB.70.144101.
B. Barbier, C. Combettes, S. Guillemet-Fritsch, T. Chartier, F. Rossignol, A. Rumeau, T. Lebey and E. Dutarde, J. Eur. Ceram. Soc., 29, 731 (2009); https://doi.org/10.1016/j.jeurceramsoc.2008.07.042.
V. Senthil, T. Badapanda, A.B. Chandra and S. Panigrahi, ISRN Ceramics, Article ID 943734 (2012); https://doi.org/10.5402/2012/943734.
S. Suresh, Int. J. Phys. Sci., 8, 1121 (2013); https://doi.org/10.5897/IJPS2013.3926.
T. Badapanda, S. Venkatesan, S. Panigrahi and P. Kumar, Process. Appl. Ceramics, 7, 135 (2013); https://doi.org/10.2298/PAC1303135B.
B. Mohanty, P.S. Sahoo, M.P.K. Sahoo and R.N.P. Choudhary, J. Mod. Phys., 3, 357 (2012); https://doi.org/10.4236/jmp.2012.35050.
S.K. Rao and M.D. Prasad, Ceram. Silik., 52, 190 (2008).
A.F.L. Almeida, P.B.A. Fechine, J.C. Góes, M.A. Valente, M.A.R. Miranda and A.S.B. Sombra, Mater. Sci. Eng. B, 111, 113 (2004); https://doi.org/10.1016/j.mseb.2004.03.027.
R. Kumar, R. Rani and S. Sharma, Adv. Mater. Lett., 5, 658 (2014); https://doi.org/10.5185/amlett.2014.3600.
N. Kolev, R.P. Bontchev, M.A.J. Jacobson, V.N. Popov, V.G. Hadjiev, A.P. Litvinchuk and M.N. Iliev, Phys. Rev. B, 66, 132102 (2002); https://doi.org/10.1103/PhysRevB.66.132102.
J. Liu, R.W. Smith and W.-N. Mei, Chem. Mater., 19, 6020 (2007); https://doi.org/10.1021/cm0716553.
C. Mingxiang, P.H.D. Thesis, Extrinsic Dielectric Relaxation of Colossal Dielectric Constant Material CaCu3Ti4O12, Department of Applied Physics, Polytechnic University, Hong Kong (2011).
I. Norezan, A.K. Yahya and M.K. Talari, J. Mater. Sci. Technol., 28, 1137 (2012); https://doi.org/10.1016/S1005-0302(12)60183-2.
L. Singh, U.S. Rai, K.D. Mandal and A.K. Rai, Appl. Phys. A, 112, 891 (2013); https://doi.org/10.1007/s00339(2012)012-7443-z.
E.J.J. Mallmann, M.A.S. Silva, A.S.B. Sombra, M.A. Botelho, S.E. Mazzetto, A.S. de Menezes, A.F.L. Almeida and P.B.A. Fechine, J. Electr. Mater., 44, 295 (2015); https://doi.org/10.1007/s11664-014-3464-z.
J. Shanker, M.B. Suresh and D.S. Babu, Int. J. Sci. Eng. Res., 3, 194 (2015).
L. Singh, K.D. Mandal, U.S. Rai and A.K. Rai, Indian J. Phys., 88, 665 (2014); https://doi.org/10.1007/s12648-014-0471-0.