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Abstract

Tin dioxide thin films were prepared by sol-gel dip coating technique using SnCl2·2H2O and ammonium hydroxide solution. The obtained thin film slides have been annealed at different temperature (200, 400 and 600 °C) in air at constant time (90 min). Structure and surface morphology of SnO2 thin films were investigated and characterized by X-ray diffraction, atomic force microscope, scanning electron microscope, UV/visible and FTIR measurements. The optical properties of SnO2 thin film were studied, such as transmittance, extinction coefficient, absorption coefficient and optical energy gap. The X-ray diffraction indicates a decreasing in crystaline size with increasing of doping concentration. The optical energy band gap was increased with the annealing temperature in range of (3.6 to 3.9) eV.

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SnO2 thin film X-ray diffraction Morphology Energy gap

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