Chul Kim1 Y, Seob Kim2 H, Oh Park3 J, Kweon Jang3 W. Fabrication and Characterization of a Low Voltage Micro-Electron Column for Scan Field Size and Magnification. ajc [Internet]. 2011 Jan. 31 [cited 2024 Nov. 23];23(5):2303-5. Available from: https://asianpubs.org/index.php/ajchem/article/view/10321