Bahari, A., R. Eimeri, and R. Rezazadeh. “Leakage Current Through the Ultra Thin Silicon Dioxide”. Asian Journal of Chemistry 21, no. 3 (March 30, 2010): 2399–2404. Accessed November 29, 2024. https://asianpubs.org/index.php/ajchem/article/view/18742.