JOON YOON, Young; KIM, Mi-Yang; SEOP KWAK, Joon. Damage-free Structural and Optical Characterization for InGaN/GaN Multi-Quantum Well Epi-Layers. Asian Journal of Chemistry, [S. l.], v. 25, n. 10, p. 5607–5610, 2013. DOI: 10.14233/ajchem.2013.OH35. Disponível em: https://asianpubs.org/index.php/ajchem/article/view/25_10_87. Acesso em: 17 jul. 2024.