KRISHNA SUWAL, Om; SHARMA, Anjli; KIM, Dae-Wook; OH, Tae-Sik; KIM, Ho-Seob; JUNG KIM, Young; KIM, Young-Chul. Scan Range Analysis According to Variation of Einzel Lens Electrode Gap in Microcolumn. Asian Journal of Chemistry, [S. l.], v. 26, n. 5, p. 1408–1412, 2014. DOI: 10.14233/ajchem.2014.17245. Disponível em: https://asianpubs.org/index.php/ajchem/article/view/26_6_44. Acesso em: 23 jul. 2024.