LIU, Xiang; LIU, Hui. Study on Modification of SiO2 Thin Film Surface Morphology and Its Electrical Performance. Asian Journal of Chemistry, [S. l.], v. 26, n. 12, p. 3453–3456, 2014. DOI: 10.14233/ajchem.2014.15907. Disponível em: https://asianpubs.org/index.php/ajchem/article/view/26_13_3. Acesso em: 23 dec. 2024.