CHUL KIM1, Young; SEOB KIM2, Ho; OH PARK3, Jun; KWEON JANG3, Won. Fabrication and Characterization of a Low Voltage Micro-Electron Column for Scan Field Size and Magnification. Asian Journal of Chemistry, [S. l.], v. 23, n. 5, p. 2303–2305, 2011. Disponível em: https://asianpubs.org/index.php/ajchem/article/view/10321. Acesso em: 23 nov. 2024.